Mobile Surface Reflectometry
نویسندگان
چکیده
منابع مشابه
Continuous-wave ultrasound reflectometry for surface roughness imaging applications.
BACKGROUND Measurement of surface roughness irregularities that result from various sources such as manufacturing processes, surface damage, and corrosion, is an important indicator of product quality for many nondestructive testing (NDT) industries. Many techniques exist, however because of their qualitative, time-consuming and direct-contact modes, it is of some importance to work out new exp...
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An analysis of spaceborne Global Positioning System reflectometry (GPS-R) data from the TechDemoSat-1 (TDS-1) satellite is carried out to image the ocean sea surface height (SSH). An SSH estimation algorithm is applied to GPS-R delay waveforms over two regions in the South Atlantic and the North Pacific. Estimatesmade fromTDS-1 overpasses during a 6month period are aggregated to produce SSHmaps...
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Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for measuring reflectance are cumbersome, however, and although the process can be streamlined using cameras, projectors and clever catadioptrics, it generally requires complex infrastructure. In this paper we propose a simpler method for inferring reflectance from images, one th...
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We address the problem of inferring homogeneous reflectance (BRDF) from a single image of a known shape in an unknown real-world lighting environment. With appropriate representations of lighting and reflectance, the image provides bilinear constraints on the two signals, and our task is to blindly isolate the latter. We achieve this by leveraging the statistics of real-world illumination and e...
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We present a technique for rapid capture of high quality bidirectional reflection distribution functions(BRDFs) of surface points. Our method represents the BRDF at each point by a generalized microfacet model with tabulated normal distribution function (NDF) and assumes that the BRDF is symmetrical. A compact and light-weight reflectometry apparatus is developed for capturing reflectance data ...
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ژورنال
عنوان ژورنال: Computer Graphics Forum
سال: 2015
ISSN: 0167-7055
DOI: 10.1111/cgf.12719